Книга "Transmission Electron Microscopy in Micro-nanoelectronics" - Alain Claverie

Автор: Alain Claverie

Название: Transmission Electron Microscopy in Micro-nanoelectronics

Категория: Наука, Образование/Техническая литература

Издательство: John Wiley & Sons Limited

ISBN: John Wiley & Sons Limited

Тип: book

Описание: Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large num

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