Автор: Alain Claverie
Название: Transmission Electron Microscopy in Micro-nanoelectronics
Категория: Наука, Образование/Техническая литература
Издательство: John Wiley & Sons Limited
ISBN: John Wiley & Sons Limited
Тип: book
Описание: Today, the availability of bright and highly coherent electron sources and sensitive detectors has radically changed the type and quality of the information which can be obtained by transmission electron microscopy (TEM). TEMs are now present in large num
Доступна для скачивания после оплаты