Автор: Philippe Pougnet
Название: Nanometer-scale Defect Detection Using Polarized Light
Категория: Наука, Образование/Техническая литература
Издательство: John Wiley & Sons Limited
ISBN: John Wiley & Sons Limited
Тип: book
Описание: This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experime
Доступна для скачивания после оплаты
