Автор: Michael Quinten
Название: A Practical Guide to Optical Metrology for Thin Films
Категория: Наука, Образование/Прочая образовательная литература
Издательство: John Wiley & Sons Limited
ISBN: John Wiley & Sons Limited
Тип: book
Описание: A one-stop, concise guide on determining and measuring thin film thickness by optical methods. This practical book covers the laws of electromagnetic radiation and interaction of light with matter, as well as the theory and practice of thickness measureme
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